The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Ungkapan mudah untuk rintangan penyempitan bintik konduktif beramai-ramai telah dirumus secara analitik oleh Greenwood. Ungkapan ini, walau bagaimanapun, termasuk beberapa anggaran. Nakamura membentangkan bahawa rintangan penyempitan satu titik bulat yang dikira menggunakan BEM ditutup kepada nilai tepat Maxwell. Ralat relatif ini hanya e=0. 00162 [%). Dalam kajian ini, rintangan penyempitan dua, lima dan sepuluh titik pengalir dikira menggunakan kaedah unsur sempadan (BEM), dan dibandingkan dengan yang diperoleh menggunakan ungkapan Greenwood. Apabila bintik pengalir bergerak rapat antara satu sama lain, sisihan berangka antara rintangan penyempitan dikira menggunakan ungkapan Greenwood dan peningkatan BEM. Akibatnya, rintangan bersama yang dikira oleh BEM adalah lebih besar daripada yang diperoleh daripada ungkapan Greenwood. Sisihan berangka antara jumlah rintangan yang dikira oleh ungkapan Greenwood dan oleh BEM adalah kecil. Oleh itu, ungkapan Greenwood adalah sah untuk pengiraan rintangan penyempitan jumlah dan boleh digunakan untuk masalah di mana hanya jumlah rintangan dua permukaan sentuhan, seperti geganti dan suis, diperlukan. Walau bagaimanapun, sisihan berangka antara rintangan separa yang dikira oleh ungkapan Greenwood dan oleh BEM adalah sangat besar. Pengiraan rintangan separa bintik konduktor beramai-ramai berada di luar julat ungkapan Greenwood yang berkenaan, kerana ungkapan Greenwood untuk rintangan penyempitan dua bintik konduktif diperoleh dengan mengandaikan bahawa bintik konduktif adalah saiz yang sama. Khususnya, sisihan antara rintangan tompok konduktif, yang berdekatan antara satu sama lain, adalah sangat besar. Dalam kes rintangan separa yang ketara dalam peranti semikonduktor, ungkapan Greenwood tidak boleh digunakan dengan ketepatan tinggi.
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Salinan
Hitoshi NISHIYAMA, Isao MINOWA, "A Study of the Approximate Expressions for Constriction Resistance of Multitude Conducting Spots" in IEICE TRANSACTIONS on Electronics,
vol. E82-C, no. 1, pp. 25-32, January 1999, doi: .
Abstract: Simple expressions for constriction resistance of multitude conducting spots were analytically formulated by Greenwood. These expressions, however, include some approximations. Nakamura presented that the constriction resistance of one circular spot computed using the BEM is closed to Maxwell's exact value. This relative error is only e=0. 00162 [%]. In this study, the constriction resistances of two, five and ten conducting spots are computed using the boundary element method (BEM), and compared with those obtained using Greenwood's expressions. As the conducting spots move close to each other, the numerical deviations between constriction resistances computed using Greenwood's expressions and the BEM increase. As a result, mutual resistance computed by the BEM is larger than that obtained from Greenwood's expressions. The numerical deviations between the total resistances computed by Greenwood's expressions and that by the BEM are small. Hence, Greenwood's expressions are valid for the total constriction resistance calculation and can be applied to problems where only the total resistance of two contact surfaces, such as a relay and a switch, is required. However, the numerical deviations between the partial resistances computed by Greenwood's expression and that by the BEM are very large. The partial resistance calculations of multitude conducting spots are beyond the applicable range of Greenwood's expression, since Greenwood's expression for constriction resistance of two conducting spots is obtained by assuming that the conducting spots are equal size. In particular, the deviation between resistances of conducting spots, which are close to each other, is very large. In the case of partial resistances which are significant in semiconductor devices, Greenwood's expressions cannot be used with high precision.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e82-c_1_25/_p
Salinan
@ARTICLE{e82-c_1_25,
author={Hitoshi NISHIYAMA, Isao MINOWA, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Study of the Approximate Expressions for Constriction Resistance of Multitude Conducting Spots},
year={1999},
volume={E82-C},
number={1},
pages={25-32},
abstract={Simple expressions for constriction resistance of multitude conducting spots were analytically formulated by Greenwood. These expressions, however, include some approximations. Nakamura presented that the constriction resistance of one circular spot computed using the BEM is closed to Maxwell's exact value. This relative error is only e=0. 00162 [%]. In this study, the constriction resistances of two, five and ten conducting spots are computed using the boundary element method (BEM), and compared with those obtained using Greenwood's expressions. As the conducting spots move close to each other, the numerical deviations between constriction resistances computed using Greenwood's expressions and the BEM increase. As a result, mutual resistance computed by the BEM is larger than that obtained from Greenwood's expressions. The numerical deviations between the total resistances computed by Greenwood's expressions and that by the BEM are small. Hence, Greenwood's expressions are valid for the total constriction resistance calculation and can be applied to problems where only the total resistance of two contact surfaces, such as a relay and a switch, is required. However, the numerical deviations between the partial resistances computed by Greenwood's expression and that by the BEM are very large. The partial resistance calculations of multitude conducting spots are beyond the applicable range of Greenwood's expression, since Greenwood's expression for constriction resistance of two conducting spots is obtained by assuming that the conducting spots are equal size. In particular, the deviation between resistances of conducting spots, which are close to each other, is very large. In the case of partial resistances which are significant in semiconductor devices, Greenwood's expressions cannot be used with high precision.},
keywords={},
doi={},
ISSN={},
month={January},}
Salinan
TY - JOUR
TI - A Study of the Approximate Expressions for Constriction Resistance of Multitude Conducting Spots
T2 - IEICE TRANSACTIONS on Electronics
SP - 25
EP - 32
AU - Hitoshi NISHIYAMA
AU - Isao MINOWA
PY - 1999
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E82-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 1999
AB - Simple expressions for constriction resistance of multitude conducting spots were analytically formulated by Greenwood. These expressions, however, include some approximations. Nakamura presented that the constriction resistance of one circular spot computed using the BEM is closed to Maxwell's exact value. This relative error is only e=0. 00162 [%]. In this study, the constriction resistances of two, five and ten conducting spots are computed using the boundary element method (BEM), and compared with those obtained using Greenwood's expressions. As the conducting spots move close to each other, the numerical deviations between constriction resistances computed using Greenwood's expressions and the BEM increase. As a result, mutual resistance computed by the BEM is larger than that obtained from Greenwood's expressions. The numerical deviations between the total resistances computed by Greenwood's expressions and that by the BEM are small. Hence, Greenwood's expressions are valid for the total constriction resistance calculation and can be applied to problems where only the total resistance of two contact surfaces, such as a relay and a switch, is required. However, the numerical deviations between the partial resistances computed by Greenwood's expression and that by the BEM are very large. The partial resistance calculations of multitude conducting spots are beyond the applicable range of Greenwood's expression, since Greenwood's expression for constriction resistance of two conducting spots is obtained by assuming that the conducting spots are equal size. In particular, the deviation between resistances of conducting spots, which are close to each other, is very large. In the case of partial resistances which are significant in semiconductor devices, Greenwood's expressions cannot be used with high precision.
ER -