The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Pemodelan matematik berasaskan ukuran ialah pendekatan yang menarik untuk mensimulasikan, dengan tepat dan cekap, litar berdasarkan peranti aktif daripada pelbagai proses dan teknologi yang sentiasa berubah. Prinsip pendekatan berasaskan pengukuran ialah selalunya paling praktikal untuk mencirikan peranti dengan pelbagai pengukuran frekuensi tinggi, dan kemudian secara matematik mengubah data untuk menghasilkan model dinamik peranti ramalan untuk isyarat kecil (linear) dan isyarat besar ( bukan linear) tujuan reka bentuk litar. Walau bagaimanapun, terdapat banyak pertimbangan matematik, fizikal dan pengukuran yang mesti dimasukkan ke dalam mana-mana rangka kerja yang baik untuk pemodelan berasaskan pengukuran yang berjaya. Kertas kerja ini akan mengkaji beberapa asas subjek dan membincangkan beberapa trend masa depan. Topik semakan termasuk membina hubungan konstitutif tak linear daripada data linear yang diparameterkan oleh titik operasi dan undang-undang pemuliharaan termasuk pemuliharaan cas terminal dan pemuliharaan tenaga. Kemajuan dan trend terkini akan dibincangkan, seperti berdenyut I-V dan berdenyut S-pencirian parameter dengan implikasi untuk model dinamik elektro-terma dan penyebaran, ukuran bentuk gelombang tak linear, dan hubungan dengan beberapa pendekatan pemodelan tingkah laku kotak hitam.
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Salinan
David E. ROOT, "Measurement-Based Mathematical Active Device Modeling for High Frequency Circuit Simulation" in IEICE TRANSACTIONS on Electronics,
vol. E82-C, no. 6, pp. 924-936, June 1999, doi: .
Abstract: Measurement-based mathematical modeling is an attractive approach for simulating, accurately and efficiently, circuits based on active devices from a diverse range of constantly evolving processes and technologies. The principle of the measurement-based approach is that it is often most practical to characterize the device with various high-frequency measurements, and then mathematically transform the data to produce predictive device dynamical models for small-signal (linear) and large-signal (nonlinear) circuit design purposes. There are many mathematical, physical, and measurement considerations, however, that must be incorporated into any sound framework for successful measurement-based modeling. This paper will review some foundations of the subject and discuss some future trends. Review topics include constructing nonlinear constitutive relations from linear data parameterized by operating point and conservation laws including terminal charge conservation and energy conservation. Recent advances and trends will be discussed, such as pulsed I-V and pulsed S-parameter characterization with implications for electro-thermal and dispersive dynamical models, nonlinear wave-form measurements, and the relationship to some black-box behavioral modeling approaches.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e82-c_6_924/_p
Salinan
@ARTICLE{e82-c_6_924,
author={David E. ROOT, },
journal={IEICE TRANSACTIONS on Electronics},
title={Measurement-Based Mathematical Active Device Modeling for High Frequency Circuit Simulation},
year={1999},
volume={E82-C},
number={6},
pages={924-936},
abstract={Measurement-based mathematical modeling is an attractive approach for simulating, accurately and efficiently, circuits based on active devices from a diverse range of constantly evolving processes and technologies. The principle of the measurement-based approach is that it is often most practical to characterize the device with various high-frequency measurements, and then mathematically transform the data to produce predictive device dynamical models for small-signal (linear) and large-signal (nonlinear) circuit design purposes. There are many mathematical, physical, and measurement considerations, however, that must be incorporated into any sound framework for successful measurement-based modeling. This paper will review some foundations of the subject and discuss some future trends. Review topics include constructing nonlinear constitutive relations from linear data parameterized by operating point and conservation laws including terminal charge conservation and energy conservation. Recent advances and trends will be discussed, such as pulsed I-V and pulsed S-parameter characterization with implications for electro-thermal and dispersive dynamical models, nonlinear wave-form measurements, and the relationship to some black-box behavioral modeling approaches.},
keywords={},
doi={},
ISSN={},
month={June},}
Salinan
TY - JOUR
TI - Measurement-Based Mathematical Active Device Modeling for High Frequency Circuit Simulation
T2 - IEICE TRANSACTIONS on Electronics
SP - 924
EP - 936
AU - David E. ROOT
PY - 1999
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E82-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 1999
AB - Measurement-based mathematical modeling is an attractive approach for simulating, accurately and efficiently, circuits based on active devices from a diverse range of constantly evolving processes and technologies. The principle of the measurement-based approach is that it is often most practical to characterize the device with various high-frequency measurements, and then mathematically transform the data to produce predictive device dynamical models for small-signal (linear) and large-signal (nonlinear) circuit design purposes. There are many mathematical, physical, and measurement considerations, however, that must be incorporated into any sound framework for successful measurement-based modeling. This paper will review some foundations of the subject and discuss some future trends. Review topics include constructing nonlinear constitutive relations from linear data parameterized by operating point and conservation laws including terminal charge conservation and energy conservation. Recent advances and trends will be discussed, such as pulsed I-V and pulsed S-parameter characterization with implications for electro-thermal and dispersive dynamical models, nonlinear wave-form measurements, and the relationship to some black-box behavioral modeling approaches.
ER -