The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Kami membentangkan beberapa masalah pengikatan yang mencabar untuk peranti berbilang dimensi dan simulasi proses dan membincangkan cara strategi baharu mungkin menyumbang kepada penyelesaiannya. Merumuskan keperluan kualiti grid untuk pendiskretan kaedah kotak Scharfetter-Gummel standard dalam simulasi peranti, kami menunjukkan cara teknik mengimbangi dibandingkan dengan kaedah penjanaan grid quadtree dan cara ia digunakan pada reka bentuk peranti moden. Selanjutnya kami membentangkan pendekatan penyesuaian grid yang menghormati kriteria kualiti grid dan menyentuh kesukaran penyesuaian utama dalam simulasi peranti. Untuk grid sempadan bergerak 3D dalam simulasi proses kami mempersembahkan algoritma baharu.
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Salinan
Jens KRAUSE, Bernhard SCHMITHUSEN, Luis VILLABLANCA, Wolfgang FICHTNER, "New Developments and Old Problems in Grid Generation and Adaptation for TCAD Applications" in IEICE TRANSACTIONS on Electronics,
vol. E83-C, no. 8, pp. 1331-1337, August 2000, doi: .
Abstract: We present several challenging gridding problems for multi-dimensional device and process simulation and discuss how new strategies might contribute to their solution. Formulating grid quality requirements for the standard Scharfetter-Gummel box method discretization in device simulation, we demonstrate how the offsetting techniques compares with quadtree grid generation methods and how they apply to modern device designs. Further we present a grid adaptation approach which respects the grid quality criteria and touch upon the main adaptation difficulties within device simulation. For the 3D moving boundary grids in process simulation we present a new algorithm.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e83-c_8_1331/_p
Salinan
@ARTICLE{e83-c_8_1331,
author={Jens KRAUSE, Bernhard SCHMITHUSEN, Luis VILLABLANCA, Wolfgang FICHTNER, },
journal={IEICE TRANSACTIONS on Electronics},
title={New Developments and Old Problems in Grid Generation and Adaptation for TCAD Applications},
year={2000},
volume={E83-C},
number={8},
pages={1331-1337},
abstract={We present several challenging gridding problems for multi-dimensional device and process simulation and discuss how new strategies might contribute to their solution. Formulating grid quality requirements for the standard Scharfetter-Gummel box method discretization in device simulation, we demonstrate how the offsetting techniques compares with quadtree grid generation methods and how they apply to modern device designs. Further we present a grid adaptation approach which respects the grid quality criteria and touch upon the main adaptation difficulties within device simulation. For the 3D moving boundary grids in process simulation we present a new algorithm.},
keywords={},
doi={},
ISSN={},
month={August},}
Salinan
TY - JOUR
TI - New Developments and Old Problems in Grid Generation and Adaptation for TCAD Applications
T2 - IEICE TRANSACTIONS on Electronics
SP - 1331
EP - 1337
AU - Jens KRAUSE
AU - Bernhard SCHMITHUSEN
AU - Luis VILLABLANCA
AU - Wolfgang FICHTNER
PY - 2000
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E83-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 2000
AB - We present several challenging gridding problems for multi-dimensional device and process simulation and discuss how new strategies might contribute to their solution. Formulating grid quality requirements for the standard Scharfetter-Gummel box method discretization in device simulation, we demonstrate how the offsetting techniques compares with quadtree grid generation methods and how they apply to modern device designs. Further we present a grid adaptation approach which respects the grid quality criteria and touch upon the main adaptation difficulties within device simulation. For the 3D moving boundary grids in process simulation we present a new algorithm.
ER -