The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Kami menunjukkan pengimbasan tanpa apertur mikroskop optik dekat medan menggunakan penonjolan kecil (zarah polistirena berdiameter 500-nm mudah) pada substrat kaca rata sebagai probe. Kami mereka bentuk peringkat sampel kecil untuk beroperasi dengan probe zarah. Ia adalah peringkat bulatan berdiameter 40-µm, yang direka daripada gentian optik dengan etsa asid Hidrofluorik (HF). Dalam makalah ini, kami membentangkan mikroskop daya atom pertama dan mengimbas imej mikroskop optik berhampiran medan yang diperoleh dengan siasatan sedemikian. Kami juga membincangkan skim untuk kawalan jarak sampel probe dalam bentuk baru pengimbasan tanpa apertur mikroskop optik dekat medan ini.
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Salinan
Noritaka YAMAMOTO, Takashi HIRAGA, "Small Protrusion Used as a Probe for Apertureless Scanning Near-Field Optical Microscopy" in IEICE TRANSACTIONS on Electronics,
vol. E85-C, no. 12, pp. 2104-2108, December 2002, doi: .
Abstract: We demonstrated apertureless scanning near-field optical microscopy using a small protrusion (a simple 500-nm-diameter polystyrene particle) on a flat glass substrate as a probe. We designed a small sample stage to operate with the particle probe. It is a 40-µm-diameter circular stage, fabricated from an optical fiber by Hydrofluoric acid (HF) etching. In this paper, we present the first atomic force microscope and scanning near-field optical microscope images obtained with such a probe. We also discuss schemes for probe-sample distance control in this novel form of apertureless scanning near-field optical microscopy.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e85-c_12_2104/_p
Salinan
@ARTICLE{e85-c_12_2104,
author={Noritaka YAMAMOTO, Takashi HIRAGA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Small Protrusion Used as a Probe for Apertureless Scanning Near-Field Optical Microscopy},
year={2002},
volume={E85-C},
number={12},
pages={2104-2108},
abstract={We demonstrated apertureless scanning near-field optical microscopy using a small protrusion (a simple 500-nm-diameter polystyrene particle) on a flat glass substrate as a probe. We designed a small sample stage to operate with the particle probe. It is a 40-µm-diameter circular stage, fabricated from an optical fiber by Hydrofluoric acid (HF) etching. In this paper, we present the first atomic force microscope and scanning near-field optical microscope images obtained with such a probe. We also discuss schemes for probe-sample distance control in this novel form of apertureless scanning near-field optical microscopy.},
keywords={},
doi={},
ISSN={},
month={December},}
Salinan
TY - JOUR
TI - Small Protrusion Used as a Probe for Apertureless Scanning Near-Field Optical Microscopy
T2 - IEICE TRANSACTIONS on Electronics
SP - 2104
EP - 2108
AU - Noritaka YAMAMOTO
AU - Takashi HIRAGA
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E85-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2002
AB - We demonstrated apertureless scanning near-field optical microscopy using a small protrusion (a simple 500-nm-diameter polystyrene particle) on a flat glass substrate as a probe. We designed a small sample stage to operate with the particle probe. It is a 40-µm-diameter circular stage, fabricated from an optical fiber by Hydrofluoric acid (HF) etching. In this paper, we present the first atomic force microscope and scanning near-field optical microscope images obtained with such a probe. We also discuss schemes for probe-sample distance control in this novel form of apertureless scanning near-field optical microscopy.
ER -