The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Hayat elektrik adalah parameter penting untuk menganggarkan kebolehpercayaan geganti, dan ia sangat dipengaruhi oleh arus beban. Untuk memendekkan masa ujian hayat, ujian hayat dipercepatkan tekanan arus beban telah dijalankan dengan menggunakan sistem ujian hayat yang direka untuk geganti dalam kertas ini. Semasa ujian hayat, banyak parameter seperti rintangan sentuhan, masa tutup dan masa lebih perjalanan geganti telah diukur untuk setiap operasi untuk mengenal pasti mod kegagalan. Selepas ujian hayat, mekanisme kegagalan di bawah setiap tegasan semasa, yang menyebabkan mod kegagalan yang sama, dianalisis dengan menyiasat variasi parameter dan memerhati morfologi permukaan sentuhan. Di samping itu, untuk tujuan mengkaji lebih lanjut ketekalan mekanisme kegagalan antara tekanan arus yang berbeza, analisis statistik Weibull telah diterima pakai untuk menganggar parameter bentuk taburan Weibull kerana parameter bentuk yang sama bermakna mekanisme kegagalan yang sama. Akhirnya, model statistik untuk menganggarkan jangka hayat di bawah tekanan arus beban telah dibina. Kaedah penyelidikan dan kesimpulan yang dinyatakan dalam kertas ini adalah bermakna untuk melaksanakan ujian hayat dipercepatkan untuk jenis geganti lain.
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Salinan
Shujuan WANG, Qiong YU, Li REN, Wanbin REN, "Study on Contact Failure Mechanisms of Accelerated Life Test for Relay Reliability" in IEICE TRANSACTIONS on Electronics,
vol. E92-C, no. 8, pp. 1034-1039, August 2009, doi: 10.1587/transele.E92.C.1034.
Abstract: Electrical life is an important parameter to estimate the reliability of a relay, and it is greatly affected by load current. In order to shorten the time of life test, load current stress accelerated life tests were carried out by using a life test system designed for relay in this paper. During the life test, many parameters such as the contact resistance, the closing time and the over-travel time of relay were measured for each operation to identify the failure modes. After the life test, the failure mechanisms under each current stress, which cause the same failure mode, were analyzed by investigating the variations of parameters and observing the morphology of contact surface. In addition, for the purpose of further studying the consistency of failure mechanisms between different current stress, a Weibull statistical analysis was adopted to estimate the shape parameter of Weibull distribution because the same shape parameter means the same failure mechanism. Finally, a statistical model for estimating the lifetime under load current stress was built. The research methods and conclusions mentioned in this paper are meaningful to perform the accelerated life tests for other types of relays.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E92.C.1034/_p
Salinan
@ARTICLE{e92-c_8_1034,
author={Shujuan WANG, Qiong YU, Li REN, Wanbin REN, },
journal={IEICE TRANSACTIONS on Electronics},
title={Study on Contact Failure Mechanisms of Accelerated Life Test for Relay Reliability},
year={2009},
volume={E92-C},
number={8},
pages={1034-1039},
abstract={Electrical life is an important parameter to estimate the reliability of a relay, and it is greatly affected by load current. In order to shorten the time of life test, load current stress accelerated life tests were carried out by using a life test system designed for relay in this paper. During the life test, many parameters such as the contact resistance, the closing time and the over-travel time of relay were measured for each operation to identify the failure modes. After the life test, the failure mechanisms under each current stress, which cause the same failure mode, were analyzed by investigating the variations of parameters and observing the morphology of contact surface. In addition, for the purpose of further studying the consistency of failure mechanisms between different current stress, a Weibull statistical analysis was adopted to estimate the shape parameter of Weibull distribution because the same shape parameter means the same failure mechanism. Finally, a statistical model for estimating the lifetime under load current stress was built. The research methods and conclusions mentioned in this paper are meaningful to perform the accelerated life tests for other types of relays.},
keywords={},
doi={10.1587/transele.E92.C.1034},
ISSN={1745-1353},
month={August},}
Salinan
TY - JOUR
TI - Study on Contact Failure Mechanisms of Accelerated Life Test for Relay Reliability
T2 - IEICE TRANSACTIONS on Electronics
SP - 1034
EP - 1039
AU - Shujuan WANG
AU - Qiong YU
AU - Li REN
AU - Wanbin REN
PY - 2009
DO - 10.1587/transele.E92.C.1034
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E92-C
IS - 8
JA - IEICE TRANSACTIONS on Electronics
Y1 - August 2009
AB - Electrical life is an important parameter to estimate the reliability of a relay, and it is greatly affected by load current. In order to shorten the time of life test, load current stress accelerated life tests were carried out by using a life test system designed for relay in this paper. During the life test, many parameters such as the contact resistance, the closing time and the over-travel time of relay were measured for each operation to identify the failure modes. After the life test, the failure mechanisms under each current stress, which cause the same failure mode, were analyzed by investigating the variations of parameters and observing the morphology of contact surface. In addition, for the purpose of further studying the consistency of failure mechanisms between different current stress, a Weibull statistical analysis was adopted to estimate the shape parameter of Weibull distribution because the same shape parameter means the same failure mechanism. Finally, a statistical model for estimating the lifetime under load current stress was built. The research methods and conclusions mentioned in this paper are meaningful to perform the accelerated life tests for other types of relays.
ER -