The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Rintangan penyempitan dikira dengan analisis berangka menggunakan persamaan Laplace untuk potensi elektrik keadaan mantap dalam banyak kes status penyebaran titik sentuhan. Keputusan menunjukkan bahawa rintangan sentuhan tidak meningkat melebihi 1.5 kali walaupun jumlah kawasan sentuhan sebenar adalah kira-kira 15% daripada kawasan sentuhan ketara. Apabila kawasan sentuhan sebenar adalah sekurang-kurangnya kira-kira 60% daripada kawasan sentuhan ketara, rintangan sentuhan adalah lebih kurang sama dengan rintangan penyempitan yang diperoleh daripada kawasan sentuhan ketara. Apabila kawasan sentuhan sebenar adalah kira-kira 50% daripada kawasan sentuhan ketara, rintangan sentuhan adalah lebih kurang malar tanpa mengambil kira bentuk sesentuh dan susun atur serakan titik sesentuh. Oleh itu, terbukti bahawa rintangan sentuhan boleh dikira secara praktikal menggunakan kawasan sentuhan ketara dan bukannya kawasan sentuhan sebenar apabila terdapat banyak titik sentuhan disebabkan oleh sentuhan logam kepada logam.
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Salinan
Shigeru SAWADA, Terutaka TAMAI, Yasuhiro HATTORI, Kazuo IIDA, "Numerical Analyses for Contact Resistance due to Constriction Effect of Current Flowing through Multi-Spot Construction" in IEICE TRANSACTIONS on Electronics,
vol. E93-C, no. 6, pp. 905-911, June 2010, doi: 10.1587/transele.E93.C.905.
Abstract: Constriction resistance is calculated by numerical analysis using Laplace's equations for electric potential of steady state in many cases of contact spot dispersion-status. The results show that contact resistance does not increase beyond 1.5 times even if the total real contact area is about 15% of the apparent contact area. When real contact area is at least about 60% of the apparent contact area, the contact resistance is approximately the same as the constriction resistance acquired from the apparent contact area. When the real contact area is about 50% of the apparent contact area, the contact resistance is approximately constant without regard to the contact shape and contact-point dispersion layout. Therefore, it is proved that contact resistance can be practically calculated using apparent contact area instead of real contact area when there are many contact points caused by metal to metal contact.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E93.C.905/_p
Salinan
@ARTICLE{e93-c_6_905,
author={Shigeru SAWADA, Terutaka TAMAI, Yasuhiro HATTORI, Kazuo IIDA, },
journal={IEICE TRANSACTIONS on Electronics},
title={Numerical Analyses for Contact Resistance due to Constriction Effect of Current Flowing through Multi-Spot Construction},
year={2010},
volume={E93-C},
number={6},
pages={905-911},
abstract={Constriction resistance is calculated by numerical analysis using Laplace's equations for electric potential of steady state in many cases of contact spot dispersion-status. The results show that contact resistance does not increase beyond 1.5 times even if the total real contact area is about 15% of the apparent contact area. When real contact area is at least about 60% of the apparent contact area, the contact resistance is approximately the same as the constriction resistance acquired from the apparent contact area. When the real contact area is about 50% of the apparent contact area, the contact resistance is approximately constant without regard to the contact shape and contact-point dispersion layout. Therefore, it is proved that contact resistance can be practically calculated using apparent contact area instead of real contact area when there are many contact points caused by metal to metal contact.},
keywords={},
doi={10.1587/transele.E93.C.905},
ISSN={1745-1353},
month={June},}
Salinan
TY - JOUR
TI - Numerical Analyses for Contact Resistance due to Constriction Effect of Current Flowing through Multi-Spot Construction
T2 - IEICE TRANSACTIONS on Electronics
SP - 905
EP - 911
AU - Shigeru SAWADA
AU - Terutaka TAMAI
AU - Yasuhiro HATTORI
AU - Kazuo IIDA
PY - 2010
DO - 10.1587/transele.E93.C.905
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E93-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2010
AB - Constriction resistance is calculated by numerical analysis using Laplace's equations for electric potential of steady state in many cases of contact spot dispersion-status. The results show that contact resistance does not increase beyond 1.5 times even if the total real contact area is about 15% of the apparent contact area. When real contact area is at least about 60% of the apparent contact area, the contact resistance is approximately the same as the constriction resistance acquired from the apparent contact area. When the real contact area is about 50% of the apparent contact area, the contact resistance is approximately constant without regard to the contact shape and contact-point dispersion layout. Therefore, it is proved that contact resistance can be practically calculated using apparent contact area instead of real contact area when there are many contact points caused by metal to metal contact.
ER -