The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Sistem Pemeriksaan Penglihatan Automatik LCD (AVI) secara automatik mengesan ciri kecacatan dan mengukur saiznya melalui penglihatan kamera. Sistem AVI biasanya melaporkan ukuran yang berbeza pada kecacatan yang sama dengan beberapa variasi pada kedudukan atau putaran terutamanya kerana kami mendapat imej yang berbeza. Ini disebabkan oleh kemungkinan variasi dalam proses pemerolehan imej termasuk faktor optik, pencahayaan tidak seragam, hingar rawak, dan sebagainya. Atas sebab ini, kaedah pengukuran kecacatan berasaskan kawasan konvensional mempunyai beberapa masalah dari segi kekukuhan dan konsistensi. Dalam kertas kerja ini, kami mencadangkan kaedah pengukuran saiz kecacatan baharu untuk mengatasi masalah ini. Kami menggunakan maklumat volum yang diabaikan sepenuhnya dalam kaedah pengukuran kecacatan konvensional berasaskan kawasan. Kami memilih bentuk loceng sebagai model kecacatan untuk eksperimen. Keputusan menunjukkan bahawa kaedah cadangan kami secara mendadak meningkatkan keteguhan ukuran saiz kecacatan. Memandangkan pemodelan yang betul, kaedah pengukuran berasaskan isipadu yang dicadangkan boleh digunakan untuk pelbagai jenis kecacatan untuk keteguhan dan ketekalan yang lebih baik.
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Salinan
Young-Bok JOO, Chan-Ho HAN, Kil-Houm PARK, "Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System" in IEICE TRANSACTIONS on Electronics,
vol. E93-C, no. 6, pp. 922-928, June 2010, doi: 10.1587/transele.E93.C.922.
Abstract: LCD Automatic Vision Inspection (AVI) systems automatically detect defect features and measure their sizes via camera vision. AVI systems usually report different measurements on the same defect with some variations on position or rotation mainly because we get different images. This is caused by possible variations in the image acquisition process including optical factors, non-uniform illumination, random noise, and so on. For this reason, conventional area based defect measuring method has some problems in terms of robustness and consistency. In this paper, we propose a new defect size measuring method to overcome these problems. We utilize volume information which is completely ignored in the area based conventional defect measuring method. We choose a bell shape as a defect model for experiment. The results show that our proposed method dramatically improves robustness of defect size measurement. Given proper modeling, the proposed volume based measuring method can be applied to various types of defect for better robustness and consistency.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E93.C.922/_p
Salinan
@ARTICLE{e93-c_6_922,
author={Young-Bok JOO, Chan-Ho HAN, Kil-Houm PARK, },
journal={IEICE TRANSACTIONS on Electronics},
title={Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System},
year={2010},
volume={E93-C},
number={6},
pages={922-928},
abstract={LCD Automatic Vision Inspection (AVI) systems automatically detect defect features and measure their sizes via camera vision. AVI systems usually report different measurements on the same defect with some variations on position or rotation mainly because we get different images. This is caused by possible variations in the image acquisition process including optical factors, non-uniform illumination, random noise, and so on. For this reason, conventional area based defect measuring method has some problems in terms of robustness and consistency. In this paper, we propose a new defect size measuring method to overcome these problems. We utilize volume information which is completely ignored in the area based conventional defect measuring method. We choose a bell shape as a defect model for experiment. The results show that our proposed method dramatically improves robustness of defect size measurement. Given proper modeling, the proposed volume based measuring method can be applied to various types of defect for better robustness and consistency.},
keywords={},
doi={10.1587/transele.E93.C.922},
ISSN={1745-1353},
month={June},}
Salinan
TY - JOUR
TI - Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System
T2 - IEICE TRANSACTIONS on Electronics
SP - 922
EP - 928
AU - Young-Bok JOO
AU - Chan-Ho HAN
AU - Kil-Houm PARK
PY - 2010
DO - 10.1587/transele.E93.C.922
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E93-C
IS - 6
JA - IEICE TRANSACTIONS on Electronics
Y1 - June 2010
AB - LCD Automatic Vision Inspection (AVI) systems automatically detect defect features and measure their sizes via camera vision. AVI systems usually report different measurements on the same defect with some variations on position or rotation mainly because we get different images. This is caused by possible variations in the image acquisition process including optical factors, non-uniform illumination, random noise, and so on. For this reason, conventional area based defect measuring method has some problems in terms of robustness and consistency. In this paper, we propose a new defect size measuring method to overcome these problems. We utilize volume information which is completely ignored in the area based conventional defect measuring method. We choose a bell shape as a defect model for experiment. The results show that our proposed method dramatically improves robustness of defect size measurement. Given proper modeling, the proposed volume based measuring method can be applied to various types of defect for better robustness and consistency.
ER -