The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Kertas kerja ini mencadangkan teknik yang meningkatkan hayat peranti penyepaduan skala besar (LSI). Apabila teknologi semikonduktor bertambah baik pada pengecilan transistor, kesan penuaan akibat ketidakstabilan suhu pincang (BTI) memberi kesan serius kepada hayat mereka. BTI meningkatkan voltan ambang transistor dengan itu juga meningkatkan kelewatan peranti elektronik, mengakibatkan kegagalan akibat pelanggaran pemasaan. Untuk mengimbangi pelanggaran masa akibat penuaan, kami mengeksploitasi pengkomputeran anggaran yang boleh dikonfigurasikan. Dengan mengandaikan bahawa litar sasaran mempunyai mod tepat dan anggaran, ia dikonfigurasikan untuk mod anggaran jika penderia penuaan meramalkan pelanggaran. Eksperimen menggunakan litar contoh mendedahkan peningkatan dalam hayatnya kepada >10 tahun.
Toshinori SATO
Fukuoka University
Tomoaki UKEZONO
Fukuoka University
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Salinan
Toshinori SATO, Tomoaki UKEZONO, "Exploiting Configurable Approximations for Tolerating Aging-induced Timing Violations" in IEICE TRANSACTIONS on Fundamentals,
vol. E103-A, no. 9, pp. 1028-1036, September 2020, doi: 10.1587/transfun.2019KEP0009.
Abstract: This paper proposes a technique that increases the lifetime of large scale integration (LSI) devices. As semiconductor technology improves at miniaturizing transistors, aging effects due to bias temperature instability (BTI) seriously affects their lifetime. BTI increases the threshold voltage of transistors thereby also increasing the delay of an electronics device, resulting in failures due to timing violations. To compensate for aging-induced timing violations, we exploit configurable approximate computing. Assuming that target circuits have exact and approximate modes, they are configured for the approximate mode if an aging sensor predicts violations. Experiments using an example circuit revealed an increase in its lifetime to >10 years.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.2019KEP0009/_p
Salinan
@ARTICLE{e103-a_9_1028,
author={Toshinori SATO, Tomoaki UKEZONO, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Exploiting Configurable Approximations for Tolerating Aging-induced Timing Violations},
year={2020},
volume={E103-A},
number={9},
pages={1028-1036},
abstract={This paper proposes a technique that increases the lifetime of large scale integration (LSI) devices. As semiconductor technology improves at miniaturizing transistors, aging effects due to bias temperature instability (BTI) seriously affects their lifetime. BTI increases the threshold voltage of transistors thereby also increasing the delay of an electronics device, resulting in failures due to timing violations. To compensate for aging-induced timing violations, we exploit configurable approximate computing. Assuming that target circuits have exact and approximate modes, they are configured for the approximate mode if an aging sensor predicts violations. Experiments using an example circuit revealed an increase in its lifetime to >10 years.},
keywords={},
doi={10.1587/transfun.2019KEP0009},
ISSN={1745-1337},
month={September},}
Salinan
TY - JOUR
TI - Exploiting Configurable Approximations for Tolerating Aging-induced Timing Violations
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1028
EP - 1036
AU - Toshinori SATO
AU - Tomoaki UKEZONO
PY - 2020
DO - 10.1587/transfun.2019KEP0009
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E103-A
IS - 9
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - September 2020
AB - This paper proposes a technique that increases the lifetime of large scale integration (LSI) devices. As semiconductor technology improves at miniaturizing transistors, aging effects due to bias temperature instability (BTI) seriously affects their lifetime. BTI increases the threshold voltage of transistors thereby also increasing the delay of an electronics device, resulting in failures due to timing violations. To compensate for aging-induced timing violations, we exploit configurable approximate computing. Assuming that target circuits have exact and approximate modes, they are configured for the approximate mode if an aging sensor predicts violations. Experiments using an example circuit revealed an increase in its lifetime to >10 years.
ER -