The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Makalah ini mencadangkan sel boleh dikonfigurasikan semula berbilang pintu (RECON) dan pendekatan pemetaan semula teknologi menggunakannya sebagai sel ganti untuk pesanan perubahan kejuruteraan berfungsi (ECO) pasca topeng. Dengan peningkatan pesat dalam kerumitan litar, ECO sering berlaku dalam peringkat pasca topeng reka bentuk LSI. Untuk menangani ECO pasca topeng pada kos yang rendah, hanya lapisan logam direka bentuk semula dengan membuat perubahan fungsi menggunakan sel ganti. Untuk tujuan ini, sel 2T/4T/6T-RECON telah dicadangkan sebagai sel ganti yang boleh dikonfigurasikan semula. Walau bagaimanapun, sel RECON konvensional digunakan untuk melaksanakan fungsi tunggal, yang boleh mengakibatkan transistor tidak digunakan dalam sel. Selain itu, bilangan sel ganti 2T/4T/6T-RECON yang digunakan untuk ECO pasca topeng sangat berbeza bergantung pada litar yang akan dilaksanakan dan jenis ECO yang berlaku. Oleh itu, ECO berfungsi mungkin gagal kerana kekurangan jenis sel RECON tertentu, walaupun jenis sel RECON lain kekal. Untuk menyelesaikan masalah ini, kami mencadangkan sel RECON berbilang pintu yang melaksanakan berbilang fungsi dalam sel RECON tunggal sambil mengekalkan reka letak sel asas 4T/6T-RECON konvensional dan pendekatan pemetaan semula teknologi menggunakannya. Pendekatan yang dicadangkan bukan sahaja mengurangkan bilangan sel ganti terpakai untuk pengubahsuaian tetapi juga membenarkan penggunaan fleksibel sel ganti untuk membaikinya dengan kurang peningkatan panjang dan kelewatan wayar. Keputusan eksperimen telah mengesahkan bahawa nisbah kejayaan ECO berfungsi meningkat sebanyak 4.8pt secara purata dan jumlah bilangan sel ganti terpakai dikurangkan sebanyak 5.6% secara purata. Ia juga telah disahkan bahawa peningkatan panjang wayar dikurangkan sebanyak 17.4% secara purata dan penurunan kelonggaran ditindas sebanyak 21.6% secara purata.
Tomohiro NISHIGUCHI
Kobe University
Nobutaka KUROKI
Kobe University
Masahiro NUMA
Kobe University
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Salinan
Tomohiro NISHIGUCHI, Nobutaka KUROKI, Masahiro NUMA, "Technology Remapping Approach Using Multi-Gate Reconfigurable Cells for Post-Mask Functional ECO" in IEICE TRANSACTIONS on Fundamentals,
vol. E107-A, no. 3, pp. 592-599, March 2024, doi: 10.1587/transfun.2023VLP0015.
Abstract: This paper proposes multi-gate reconfigurable (RECON) cells and a technology remapping approach using them as spare cells for post-mask functional engineering change orders (ECOs). With the rapid increase in circuit complexity, ECOs often occur in the post-mask stage of LSI designs. To deal with post-mask ECOs at a low cost, only the metal layers are redesigned by making functional changes using spare cells. For this purpose, 2T/4T/6T-RECON cells were proposed as reconfigurable spare cells. However, conventional RECON cells are used to implement single functions, which may result in unused transistors in the cells. In addition, the number of 2T/4T/6T-RECON spare cells used for post-mask ECOs varies greatly depending on the circuit to be implemented and the type of ECO that occurs. Therefore, functional ECOs may fail due to a lack of certain types of RECON cells, even if other types of RECON cells remain. To solve this problem, we propose multi-gate RECON cells that implement multiple functions in a single RECON cell while retaining the layouts of conventional 4T/6T-RECON base cells, and a technology remapping approach using them. The proposed approach not only reduces the number of used spare cells for modifications but also allows the flexible use of spare cells to fix them with less increase in wire length and delay. Experimental results have confirmed that the functional ECO success ratio is increased by 4.8pt on average and the total number of used spare cells is reduced by 5.6% on average. It has also been confirmed that the increase in wire length is reduced by 17.4% on average and the decrease in slack is suppressed by 21.6% on average.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.2023VLP0015/_p
Salinan
@ARTICLE{e107-a_3_592,
author={Tomohiro NISHIGUCHI, Nobutaka KUROKI, Masahiro NUMA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Technology Remapping Approach Using Multi-Gate Reconfigurable Cells for Post-Mask Functional ECO},
year={2024},
volume={E107-A},
number={3},
pages={592-599},
abstract={This paper proposes multi-gate reconfigurable (RECON) cells and a technology remapping approach using them as spare cells for post-mask functional engineering change orders (ECOs). With the rapid increase in circuit complexity, ECOs often occur in the post-mask stage of LSI designs. To deal with post-mask ECOs at a low cost, only the metal layers are redesigned by making functional changes using spare cells. For this purpose, 2T/4T/6T-RECON cells were proposed as reconfigurable spare cells. However, conventional RECON cells are used to implement single functions, which may result in unused transistors in the cells. In addition, the number of 2T/4T/6T-RECON spare cells used for post-mask ECOs varies greatly depending on the circuit to be implemented and the type of ECO that occurs. Therefore, functional ECOs may fail due to a lack of certain types of RECON cells, even if other types of RECON cells remain. To solve this problem, we propose multi-gate RECON cells that implement multiple functions in a single RECON cell while retaining the layouts of conventional 4T/6T-RECON base cells, and a technology remapping approach using them. The proposed approach not only reduces the number of used spare cells for modifications but also allows the flexible use of spare cells to fix them with less increase in wire length and delay. Experimental results have confirmed that the functional ECO success ratio is increased by 4.8pt on average and the total number of used spare cells is reduced by 5.6% on average. It has also been confirmed that the increase in wire length is reduced by 17.4% on average and the decrease in slack is suppressed by 21.6% on average.},
keywords={},
doi={10.1587/transfun.2023VLP0015},
ISSN={1745-1337},
month={March},}
Salinan
TY - JOUR
TI - Technology Remapping Approach Using Multi-Gate Reconfigurable Cells for Post-Mask Functional ECO
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 592
EP - 599
AU - Tomohiro NISHIGUCHI
AU - Nobutaka KUROKI
AU - Masahiro NUMA
PY - 2024
DO - 10.1587/transfun.2023VLP0015
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E107-A
IS - 3
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - March 2024
AB - This paper proposes multi-gate reconfigurable (RECON) cells and a technology remapping approach using them as spare cells for post-mask functional engineering change orders (ECOs). With the rapid increase in circuit complexity, ECOs often occur in the post-mask stage of LSI designs. To deal with post-mask ECOs at a low cost, only the metal layers are redesigned by making functional changes using spare cells. For this purpose, 2T/4T/6T-RECON cells were proposed as reconfigurable spare cells. However, conventional RECON cells are used to implement single functions, which may result in unused transistors in the cells. In addition, the number of 2T/4T/6T-RECON spare cells used for post-mask ECOs varies greatly depending on the circuit to be implemented and the type of ECO that occurs. Therefore, functional ECOs may fail due to a lack of certain types of RECON cells, even if other types of RECON cells remain. To solve this problem, we propose multi-gate RECON cells that implement multiple functions in a single RECON cell while retaining the layouts of conventional 4T/6T-RECON base cells, and a technology remapping approach using them. The proposed approach not only reduces the number of used spare cells for modifications but also allows the flexible use of spare cells to fix them with less increase in wire length and delay. Experimental results have confirmed that the functional ECO success ratio is increased by 4.8pt on average and the total number of used spare cells is reduced by 5.6% on average. It has also been confirmed that the increase in wire length is reduced by 17.4% on average and the decrease in slack is suppressed by 21.6% on average.
ER -