The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Kebolehpercayaan GaAs MMICs (Litar Bersepadu Gelombang Mikro Monolitik) adalah bahagian penting dalam kebolehpercayaan keseluruhan penyelesaian terma dalam peranti semikonduktor. Dengan kebolehpercayaan MMIC dipertingkatkan, kadar kegagalan MMIC GaAs akan mencapai tahap yang tidak praktikal untuk diukur dengan kaedah konvensional dalam masa terdekat. Surat ini mencadangkan metodologi untuk meramalkan kebolehpercayaan GaAs MMIC dengan menggabungkan kaedah empirikal dan statistik berdasarkan data ujian hayat GaAs MMIC yang gagal sifar. Selain itu, kami menyiasat kesan faktor dipercepatkan pada kemerosotan MMIC dan membuat perbandingan antara taburan Weibull dan lognormal. Kaedah ini telah digunakan dalam penilaian kebolehpercayaan GaAs MMIC dengan jayanya.
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Salinan
Zheng-Liang HUANG, Fa-Xin YU, Shu-Ting ZHANG, Hao LUO, Ping-Hui WANG, Yao ZHENG, "Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data" in IEICE TRANSACTIONS on Fundamentals,
vol. E92-A, no. 9, pp. 2376-2379, September 2009, doi: 10.1587/transfun.E92.A.2376.
Abstract: GaAs MMICs (Monolithic Microwave Integrated Circuits) reliability is a critical part of the overall reliability of the thermal solution in semiconductor devices. With MMICs reliability improved, GaAs MMICs failure rates will reach levels which are impractical to measure with conventional methods in the near future. This letter proposes a methodology to predict the GaAs MMICs reliability by combining empirical and statistical methods based on zero-failure GaAs MMICs life testing data. Besides, we investigate the effect of accelerated factors on MMICs degradation and make a comparison between the Weibull and lognormal distributions. The method has been used in the reliability evaluation of GaAs MMICs successfully.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E92.A.2376/_p
Salinan
@ARTICLE{e92-a_9_2376,
author={Zheng-Liang HUANG, Fa-Xin YU, Shu-Ting ZHANG, Hao LUO, Ping-Hui WANG, Yao ZHENG, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data},
year={2009},
volume={E92-A},
number={9},
pages={2376-2379},
abstract={GaAs MMICs (Monolithic Microwave Integrated Circuits) reliability is a critical part of the overall reliability of the thermal solution in semiconductor devices. With MMICs reliability improved, GaAs MMICs failure rates will reach levels which are impractical to measure with conventional methods in the near future. This letter proposes a methodology to predict the GaAs MMICs reliability by combining empirical and statistical methods based on zero-failure GaAs MMICs life testing data. Besides, we investigate the effect of accelerated factors on MMICs degradation and make a comparison between the Weibull and lognormal distributions. The method has been used in the reliability evaluation of GaAs MMICs successfully.},
keywords={},
doi={10.1587/transfun.E92.A.2376},
ISSN={1745-1337},
month={September},}
Salinan
TY - JOUR
TI - Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2376
EP - 2379
AU - Zheng-Liang HUANG
AU - Fa-Xin YU
AU - Shu-Ting ZHANG
AU - Hao LUO
AU - Ping-Hui WANG
AU - Yao ZHENG
PY - 2009
DO - 10.1587/transfun.E92.A.2376
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E92-A
IS - 9
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - September 2009
AB - GaAs MMICs (Monolithic Microwave Integrated Circuits) reliability is a critical part of the overall reliability of the thermal solution in semiconductor devices. With MMICs reliability improved, GaAs MMICs failure rates will reach levels which are impractical to measure with conventional methods in the near future. This letter proposes a methodology to predict the GaAs MMICs reliability by combining empirical and statistical methods based on zero-failure GaAs MMICs life testing data. Besides, we investigate the effect of accelerated factors on MMICs degradation and make a comparison between the Weibull and lognormal distributions. The method has been used in the reliability evaluation of GaAs MMICs successfully.
ER -