The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Kertas kerja ini membentangkan teknik pengendalian X yang baru, yang menghilangkan kesan yang tidak diketahui pada tindak balas ujian padat dengan nisbah pemadatan maksimum. Kaedah yang dicadangkan bergabung dengan pemadat toleransi X semasa dan memasukkan sel penyamaran pada laluan imbasan untuk menutup X secara selektif. Dengan melakukan ini, bilangan tindak balas yang tidak diketahui dalam setiap kitaran imbasan keluar boleh dikurangkan ke tahap yang munasabah supaya pemadat toleran X sasaran akan bertolak ansur dengan pengesanan ralat yang mungkin terjamin. Ia menjamin tiada kehilangan ujian akibat kesan X, dan mencapai pemadatan maksimum yang boleh disediakan oleh pemadat tindak balas sasaran. Lebih-lebih lagi, kerana sel pelekat hanya dimasukkan pada laluan imbasan, ia tidak mempunyai kemerosotan prestasi reka bentuk. Keputusan eksperimen menunjukkan keberkesanan kaedah yang dicadangkan.
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Salinan
Youhua SHI, Nozomu TOGAWA, Masao YANAGISAWA, Tatsuo OHTSUKI, "X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction" in IEICE TRANSACTIONS on Fundamentals,
vol. E92-A, no. 12, pp. 3119-3127, December 2009, doi: 10.1587/transfun.E92.A.3119.
Abstract: This paper presents a novel X-handling technique, which removes the effect of unknowns on compacted test response with maximal compaction ratio. The proposed method combines with the current X-tolerant compactors and inserts masking cells on scan paths to selectively mask X's. By doing this, the number of unknown responses in each scan-out cycle could be reduced to a reasonable level such that the target X-tolerant compactor would tolerate with guaranteed possible error detection. It guarantees no test loss due to the effect of X's, and achieves the maximal compaction that the target response compactor could provide as well. Moreover, because the masking cells are only inserted on the scan paths, it has no performance degradation of the designs. Experimental results demonstrate the effectiveness of the proposed method.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E92.A.3119/_p
Salinan
@ARTICLE{e92-a_12_3119,
author={Youhua SHI, Nozomu TOGAWA, Masao YANAGISAWA, Tatsuo OHTSUKI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction},
year={2009},
volume={E92-A},
number={12},
pages={3119-3127},
abstract={This paper presents a novel X-handling technique, which removes the effect of unknowns on compacted test response with maximal compaction ratio. The proposed method combines with the current X-tolerant compactors and inserts masking cells on scan paths to selectively mask X's. By doing this, the number of unknown responses in each scan-out cycle could be reduced to a reasonable level such that the target X-tolerant compactor would tolerate with guaranteed possible error detection. It guarantees no test loss due to the effect of X's, and achieves the maximal compaction that the target response compactor could provide as well. Moreover, because the masking cells are only inserted on the scan paths, it has no performance degradation of the designs. Experimental results demonstrate the effectiveness of the proposed method.},
keywords={},
doi={10.1587/transfun.E92.A.3119},
ISSN={1745-1337},
month={December},}
Salinan
TY - JOUR
TI - X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 3119
EP - 3127
AU - Youhua SHI
AU - Nozomu TOGAWA
AU - Masao YANAGISAWA
AU - Tatsuo OHTSUKI
PY - 2009
DO - 10.1587/transfun.E92.A.3119
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E92-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2009
AB - This paper presents a novel X-handling technique, which removes the effect of unknowns on compacted test response with maximal compaction ratio. The proposed method combines with the current X-tolerant compactors and inserts masking cells on scan paths to selectively mask X's. By doing this, the number of unknown responses in each scan-out cycle could be reduced to a reasonable level such that the target X-tolerant compactor would tolerate with guaranteed possible error detection. It guarantees no test loss due to the effect of X's, and achieves the maximal compaction that the target response compactor could provide as well. Moreover, because the masking cells are only inserted on the scan paths, it has no performance degradation of the designs. Experimental results demonstrate the effectiveness of the proposed method.
ER -