The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. ex. Some numerals are expressed as "XNUMX".
Copyrights notice
The original paper is in English. Non-English content has been machine-translated and may contain typographical errors or mistranslations. Copyrights notice
Ujian mampatan/penyahmampatan ialah kaedah yang cekap untuk mengurangkan kos permohonan ujian. Dalam makalah ini kami mencadangkan kaedah penjanaan ujian untuk mendapatkan corak ujian yang sesuai untuk menguji pemampatan melalui pengekodan statistik. Secara umum, ATPG menjana corak ujian yang merangkumi nilai tidak peduli. Dalam kaedah kami, nilai tidak peduli sedemikian ditentukan berdasarkan anggaran kebarangkalian akhir kejadian 0/1 dalam set ujian terhasil. Keputusan eksperimen menunjukkan bahawa kaedah kami boleh menjana corak ujian yang mampu dimampatkan dengan tinggi oleh pengekodan statistik, dalam masa pengiraan yang kecil.
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Salinan
Hideyuki ICHIHARA, Atsuhiro OGAWA, Tomoo INOUE, Akio TAMURA, "Test Generation for Test Compression Based on Statistical Coding" in IEICE TRANSACTIONS on Information,
vol. E85-D, no. 10, pp. 1466-1473, October 2002, doi: .
Abstract: Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.
URL: https://global.ieice.org/en_transactions/information/10.1587/e85-d_10_1466/_p
Salinan
@ARTICLE{e85-d_10_1466,
author={Hideyuki ICHIHARA, Atsuhiro OGAWA, Tomoo INOUE, Akio TAMURA, },
journal={IEICE TRANSACTIONS on Information},
title={Test Generation for Test Compression Based on Statistical Coding},
year={2002},
volume={E85-D},
number={10},
pages={1466-1473},
abstract={Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.},
keywords={},
doi={},
ISSN={},
month={October},}
Salinan
TY - JOUR
TI - Test Generation for Test Compression Based on Statistical Coding
T2 - IEICE TRANSACTIONS on Information
SP - 1466
EP - 1473
AU - Hideyuki ICHIHARA
AU - Atsuhiro OGAWA
AU - Tomoo INOUE
AU - Akio TAMURA
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E85-D
IS - 10
JA - IEICE TRANSACTIONS on Information
Y1 - October 2002
AB - Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.
ER -